张群
,
陈柳
,
程波
,
徐步陆
,
王国忠
,
程兆年
,
谢晓明
金属学报
对倒装焊Sn-Pb焊点进行了热循环实验,结合三维全局有限元模拟的结果,研究了Sn-Pb焊点热疲劳失效.结果表明,充胶后焊点内塑性应变范围减小近一个数量级,从而显著降低焊点的疲劳损伤;由于底充胶改变了Sn-Pb焊点应力、应变分布,使得充胶前后焊点裂纹位置发生改变.Sn-Pb焊点热疲劳裂纹萌生于粗化的富Sn相,并穿过富Pb相沿富Sn相生长.Sn和Pb晶粒的非均匀粗化趋势与模拟给出的剪切应变轴向分布一致.
关键词:
倒装焊
,
null
,
null
,
null
,
null
陈柳
,
张群
,
王国忠
,
谢晓明
,
程兆年
功能材料
对倒装焊电子封装可靠性进行热循环实验和有限元模拟,结果表明,有底充胶(underfill)时,SnPb焊点的热循环寿命可提高约16倍,并确定了Coffin-Manson半经验方程的参数.采用3种底充胶材料模型,亦即定常弹性模型、温度相关弹性模型和粘弹性材料模型,描述了底充胶U8347-3的力学性能.模拟结果表明,材料模型影响计算得到的SnPb焊点的塑性应变范围、封装形变以及底充胶/芯片界面应力,采用弹性材料模型可能过高估计了SnPb焊点的热循环寿命和界面应力.
关键词:
倒装焊
,
底充胶
,
粘弹性
,
热循环
吴燕红
,
徐高卫
,
朱明华
,
周健
,
罗乐
功能材料与器件学报
doi:10.3969/j.issn.1007-4252.2008.03.004
设计和实现了一种新型的三维多芯片组件(3D-MCM).采用融合了FCOB(flip-chip on board)、COB(chip on board)、BGA(ball grid array)等技术的三维封装(3D packaging)形式,通过倒装焊和引线键合等互连技术在高密度多层有机基板上实现了塑封BGA器件和裸芯片的混载集成.对器件结构的散热特性进行了数值模拟,并对热可靠性进行了评估.实现了电功能和热机械可靠性,达到设计要求并付诸应用.
关键词:
3D-MCM
,
热设计
,
高密度基板
,
倒装焊
,
引线键合
张群
,
谢晓明
,
陈柳
,
王国忠
,
程兆年
金属学报
doi:10.3321/j.issn:0412-1961.2000.10.014
采用实验和有限元模拟,研究了底充胶分层和SnPb焊点的可靠性.结果表明,底充胶分层易发生在芯片/底充胶界面边缘处;当底充胶与芯片粘合强度较弱时,底充胶的早期分层是焊点中裂纹萌生扩展从而导致失效的直接原因;当底充胶与芯片粘合强度较强时,分层可以削弱底充胶对焊点的机械耦合作用,从而影响焊点的热循环寿命,此时,焊点热疲劳裂纹是焊点失效的直接原因.
关键词:
倒装焊
,
底充胶
,
SnPb焊点
,
分层
,
热疲劳
张群
,
陈柳
,
程波
,
徐步陆
,
王国忠
,
程兆年
,
谢晓明
金属学报
doi:10.3321/j.issn:0412-1961.2001.07.010
对倒装焊Sn-Pb焊点进行了热循环实验,结合三维全局有限元模拟的结果,研究了Sn-Pb焊点热疲劳失效.结果表明,充胶后焊点内塑性应变范围减小近一个数量级,从而显著降低焊点的疲劳损伤;由于底充胶改变了Sn-Pb焊点应力、应变分布,使得充胶前后焊点裂纹位置发生改变.Sn-Pb焊点热疲劳裂纹萌生于粗化的富Sn相,并穿过富Pb相沿富Sn相生长.Sn和Pb晶粒的非均匀粗化趋势与模拟给出的剪切应变轴向分布一致.
关键词:
倒装焊
,
底充胶
,
Sn-Pb焊点
,
分层
,
热疲劳
Y.H. Tian
金属学报(英文版)
Flip chip bonding has become a primary technology that has found application in the chip interconnection process in the electronic manufacturing industry in recent years. The solder joints of the flip chip bonding are small and consist of complicated microstructures such as Sn solution, eutectic mixture, and intermetallic compounds (IMCs), whose mechanical performance is quite different from the original solder bulk. The evolution of microstructure of the flip chip solder joints under thermal aging was analyzed. The results show that with an increase in aging time, coarsening of solder bulk matrix and AuSn4 IMCs occurred within the solder. The IMCs that are formed at the bottom side of the flip chip bond were different from those on the top side during the aging process. (Cu,Ni,Au)6Sn5 were formed at the interfaces of both sides, and large complicated (Au,Ni,Cu)Sn4 IMCs appeared for some time near the bottom interface after aging, but they disappeared again and thus (Cu,Ni,Au)6Sn5 IMC thickness increased considerably. The influence of reflow times during the flip chip bonding (as-bonded condition) on the characteristics of interfacial IMCs was weakened when subjected to the aging process.
关键词:
lead free solder
,
倒装焊
,
老化
