材料期刊网

A METHOD FOR CORRECTING INTENSITY IN CONTINU-OUS SCANNING X-RAY STRESS MEASUREMENT

LI Jiabao , HANG Zengqiao National Laboratory for Fatigue and Fracture of Materials , Institute of Metal Research , Academia Simca.Shenyang , China HE Jiawen Xi'an Jiaotong University , Xi'an , China

金属学报(英文版)

A set of absorption curves was priorly prepared on transparent films to fit the background and peak intensities in continuous scanning X-ray stress measurement.It may be better to correct both background and absorption of pure diffraction intensity.Experimental results revealed this to be a reliable correction method.

关键词: X-ray diffraction , null , null , null