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Principle and Process Window of Cerium Dioxide Thin Film Fabrication with Dual Plasma Deposition

L.P. Wang , B. Y Tang , X.B. Tian , YX.Leng , Q. YZhang , P.K.Chu

材料科学技术(英文)

Cerium dioxide, CeO2, is a potentially superior material in a myriad of areas, and many methods have been proposed to deposit single crystal CeO2 thin films. A novel fabrication technique utilizing dual plasma generated by metal vacuum arc (MEVVA) and radio frequency (RF) is discussed in this paper. We have recently conducted a systematic investigation to determine the optimal process window to deposit CeO2 thin films'on Si(100) substrates. The X-ray diffraction results show the existence of CeO2(100) in the as-deposited sample

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