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A SOLUTION OF MINIMUM NORM FOR QUANTITATIVE PHASE ANALYSIS BY STANDARDLESS X-RAY DIFFRACTION

ZHAO Han GONG Yansheng SHEN Jingyuan RUAN Qikuan JIN Jialing ZHU Hanyu Research Institute of Qiqihar Steel Works , Fulaerji , China GONG Yansheng Senior Engineer , Research Institute of Qiqihar Steel Works , Filaerji 161041 , China

金属学报(英文版)

A new expression of quantitative phase analysis by standardless X-ray diffraction has been derived using intensity matrix of vector modulus,The criterion of standardless X-ray diffraction analysis was suggested,so as to separate the diffraction pattern of every phase from that of sample.The optimal solution could be obtained by the least squares regression.

关键词: X-ray diffraction , null , null