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Analysis of AllCarbon Brick Bottom and Ceramic Cup Synthetic Hearth Bottom

ZHAO Hongbo , CHENG Shusen , ZHAO Minge

钢铁研究学报(英文版)

One of the bottlenecks of the blast furnace (BF) campaign is the life length of hearth bottom. The basic reason for the erosion of hearth bottom is its direct contact with hot metal. According to the theory of heat transfer, models of BF hearth bottom are built based on the actual examples using software and VC language, and the calculated results are in good agreement with the data of BF dissection after blowing out. The temperature distribution and the capability of the resistance to erosion for different structures of hearth bottom are analyzed, especially the two prevalent kinds of hearth bottom arrangements called “the method of heat transfer” for allcarbon brick bottom and “the method of heat isolation” for ceramic synthetic hearth bottom. Features of the two kinds of hearth bottoms are analyzed. Also the different ways of protecting the hearth bottom are clarified, according to some actual examples. After that, the same essence of prolonging life, and the fact that the existence of a “protective skull” with low thermal conductivity between the hot metal and brick layers is of utmost importance are shown.

关键词: hearth bottom;heat transfer method;heat isolation method;long life

THEREVERSSE TRANSFOR MATION OF THE STERSS INDUCEDεMIN FE 17MN 10CR 5SI 4NIALLOY

Q.S. Liu1 , 2 , 3) , L.C. Zhao3) , G.X. Dong2) and N.J. Gu1) 1) Heibei University of Technology , Tianjin 300130 , China 2) Tianjin Institute of Technology , Tianjin 300191 , China 3) Harbin University of Technology , Harbin 150001 , China

金属学报(英文版)

Theconstruction changinginthereversetransformation ofthestress induced εMin Fe 17 Mn 10 Cr 5 Si 4 Ni alloy is carefully inspected in transmission electron microscope, and then stress induced εM procedure of reverse transformation is analyzed. The behavior of reverse transformationisdissimilar when the organization of εMis different. The reversetransfor mation ofεM withtheshapeofsingle plateandstripisrelativelyeasy,anditsreversibilityincrystallographiciseasilytocarryout,fortheεM with multilayerstructure,thereversetrans formationtakes placein isolatedlayers, fortheεMthat grows well,thereversetransforma tion isrelatively difficult becauseofthe ductile harmonization between itsinternalorganiza tion structures.

关键词: stress induced εM , null , null

LIQUIDUS OF SYSTEM Ag-Cu-Ge

LIU Shuqi , YI Tao , Peking University , Beijing , China

金属学报(英文版)

The diagram of Ag-Cu-Ge system was constructed from the investigation of 13 internal sec- tions by DTA heating as well as cooling curves in an atomsphere of dry N_2 . The phase dia- gram is subdivided into two pseudo-ternary systems shown as Ag-Cu-Cu_3Ge and Ag-Cu_3Ge-Ge. Both systems belong to simple eutectic type. The ternary eutectic points lie in." E_1, Ag(22.0)-Cu(58.8)-Ge(19.2), 632℃ and E_2 , Ag(44.3)-Cu(29.5)-Ge(26.2), 533℃. The three side binary systems were redetermined.

关键词: phase diagram , null , null

Crystal structures of compounds in the pseudobinary system Gd5Ge4-La5Ge4

Journal of Alloys and Compounds

Crystal structures of compounds at ambient temperature in the pseudobinary system Gd5Ge4-La5Ge4 were studied by X-ray powder diffraction (XRD). There exist three single-phase regions in this system. The crystal structure of Gd5Ge4, La5Ge4 and Gd3La2Ge4, which are prototype compounds in three phase regions, respectively, were reported. The Gd5Ge4 and La5Ge4 crystallize in the orthorhombic Sm5Ge4-type structure with space group Pnma. The ternary intermediate compound Gd3La2Ge4, which is determined for the first time, crystallizes in the monoclinic Gd5Si2Ge2-type structure with space group P112(1)/a. The Rietveld powder diffraction profile fitting technique was used for the refinement of crystal structure. The lattice parameters, atomic occupations, interatomic distances of the Gd5Ge4, La5Ge4 and Gd3La2Ge4 compounds were derived. (C) 2003 Elsevier B.V. All rights reserved.

关键词: rare earth compounds;crystal structure;X-ray diffraction;phase-relationships;gd-5(si2ge2);transition;silicon

离子束溅射生长Ge纳米薄膜的表面形貌观察

杨杰 , 王茺 , 欧阳焜 , 杨瑞东 , 刘芳 , 杨宇

功能材料

采用离子束溅射技术并按正交试验方案生长了不同厚度以及在不同条件下退火的Ge纳米薄膜,用AFM图谱对薄膜的表面形貌进行了表征.结果表明厚度为2.8nm的Ge膜在600℃下退火10min,出现了高4nm、直径50nm左右的Ge岛,而10nm厚的Ge膜在720℃下退火120min,岛的数量较多且分布比较均匀.通过离子束溅射机理和沉积原子之间的扩散运动,对这些现象进行了较为合理的解释.

关键词: 离子束溅射 , Ge纳米薄膜 , 表面形貌 , 退火

Photoluminescence from nanometer Ge particle embedded Si oxide films

Journal of Applied Physics

Nanometer Ge particle (NGP) embedded Si oxide films were deposited on p-type Si substrates using the rf magnetron sputtering technique with a Ge-SiO2 composite target. The area ratio percentage of the Ge target to the composite target was 5%. These films were annealed in a N-2 ambient at 300, 600, 800, or 900 degrees C for 30 min. By fitting Raman scattering spectra, the average diameters of,the NGPs in the films were determined. They increased from 5.4 to 9.5 nm with increasing annealing temperatures from 600 to 900 degrees C. The photoluminescence (PL) peaks for all NGP embedded Si oxide films annealed at various temperatures are located at almost the same position around 580 nm (2.1. eV), although the average sizes of the NGPs in these films are very different from each other. After gamma-ray irradiation, the PL peak intensity increases by a factor of 2.3, with the peak position unchanged. The PL peak position does not show any evident shift when the measurement temperature increases from 10 to 300 K. All experimental facts indicate that Light emission originates mainly from the luminescence centers in the SiOx films covering the NGPs rather than from the NGPs. The role of NGPs in the PL process of the films is discussed. (C) 1998 American Institute of Physics.

关键词: visible photoluminescence;porous silicon;luminescence;confinement;mechanism;matrix;raman

Ge/Si多层膜热稳定性的Raman光谱研究

周湘萍 , 毛旭 , 张树波 , 杨宇

功能材料

用Raman光散射的方法,观察了磁控溅射技术制备的Ge/Si系列多层膜退火处理后的备Raman峰的变化,对其峰形、峰位及峰强的变化进行讨论分析.实验结果显示:Ge/Si多层膜经700℃热处理10min后,能改善各层的晶体质量,得到较完整的多层膜的结构.

关键词: Raman光谱 , Ge/Si多层膜 , 退火

[C16min]Br修饰的多壁碳纳米管及其与低密度聚乙烯复合材料的制备及介电性能

徐佩 , 卢旭鑫 , 汪传斌 , 杨善中 , 孙晓红 , 丁运生

高分子材料科学与工程

为改善多壁碳纳米管(MWNT)在低密度聚乙烯(LDPE)中的分散性及复合材料的界面特性,采用溴化-1-十六烷基-3-甲基咪唑基离子液体([C16min]Br)对MWNT进行表面改性,并用Raman光谱对改性效果进行了表征.将经过修饰的碳纳米管(MIL)与LDPE熔融共混得到MIL/LDPE复合材料,采用场发射扫描电子显微镜(FESEM)和阻抗分析仪(LCR)对复合材料的结构与介电性能进行了分析.结果表明,相比与MWNT/LDPE(渗流阈值为5.2%,介电常数为82,介电损耗为0.93),MIL/LDPE(渗流阈值为9.1%,介电常数为169,介电损耗为0.51)介电常数增大,介电损耗降低.并且在低温时,MIL/LDPE介电常数随温度的变化甚小,显示出良好的温度-介电常数特性.

关键词: 咪唑基离子液体 , 碳纳米管 , 低密度聚乙烯 , 介电性能

Thermodynamic Analysis of Ag_3Ge Phase Formation

O.P.Pandey(School of Basic and Applied Sciences , Thapar Institute of Engineering and Technology Patiala-147 001 , India )S.N.Ojha and S.Lele(Dept. of Metallurgical Engineering , Banaras Hindu University , Varanasi-221 005 , India)

材料科学技术(英文)

In the present work a thermodynamic model is presented for the nucleation of metastable Ag3Ge phase from the undercooled melt in Ag-Ge alloy system. It is shown that under kinetically induced favourable condition, nucleation of a single phase compound with an approximate stoichiometry Ag3Ge has greater affinity for nucleation over Ag and Ge based phases requiring diffusion in the liquid.

关键词:

THE EVOLUTION OF TECHNOLOGY DEVELOPMENT AT GE CORPORATE R & D

T.B.Cox(GE Corporate Research & Development , Niskayuna , NY 12309 , USA Manuscript received 26 August 1996)

金属学报(英文版)

A brief review of the nearly 100 year history of Corporate Researeh and Development at GE is presented. Observations on the changing nature and relevance of industrial research are discussed. Examples of current technology projects for aircraft engine materials are reviewed. Emphasis of these projects is placed on high performance,low cost and high quality.

关键词: :spray forming , null , null

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