Han ZHANG and Qingrong FENG (Dept. of Physics
,
Peking University
,
Beijing 100871
,
China)Y.Zhao(School of Materials Science and Engineering
,
University of New South Wales
,
Sydney 2052
,
NSW
,
Australia)F.Ritter and W.Assmus (Physikalisches Institut
,
J.W.Goet
材料科学技术(英文)
Bi2Sr2CaCu2Ox superconductor was studied by differential scanning calorimetry (DSC) and thermogravimetry (TG) in different atmospheres. It is discovered that there is a thermal anomaly in the DSC curve, associated with a weight loss in the TG curve before the melting of the sample. Careful thermal analysis and high temperature X-ray diffraction reveal that the thermal anomaly and the weight loss show an instability of the crystalline Iattice. By annealing the sample in oxygen and argon, respectively and then by TC measurement and thermal analysis, the coincidence of transition temperature with the instability is found. The coincidence is further confirmed by Y-doped 2212 phase.
关键词:
杨金瑞
,
余尚先
,
顾江楠
高分子材料科学与工程
通过对resol(羟甲基酚化合物和低分子量羟甲基酚树脂)DEPT135图谱的分析讨论,得到一系列计算resol微细结构参数的经验公式.根据DEPT135图谱可判断是否发生缩聚反应,根据经验公式可计算酚单体各个活性点参与反应百分率或酚羟基导入率、不同类型缩聚所占百分率及低分子量羟甲基酚树脂的平均核体数.
关键词:
羟甲基酚化合物
,
羟甲基酚树脂
,
DEPT135
,
结构参数
Douxing LI and Hengqiang YE (Laboratory of Atomic imaging of Solids
,
Institute of Metal Research
,
Chinese Academy of Sciences
,
Shenyang
,
110015
,
China)
材料科学技术(英文)
The present paper summarizes the current status of high resolution electron microscopy (HREM)and the applications of HREM to materials science and condensed matter physics. This review recounts the latest development of high resolution electron microscope, progress of HREM and the applications of HREM, including the crystal structure determination of microcrystalline materials and characterization of the local structure of the defects and nanostructured materials as well as qualitative and quantitative analysis of the grain boundaries, interfaces and interfacial reactions in the advanced materials by means of HREM in combination with electron diffraction,subnanometer level analysis, image simulation and image processing.
关键词: