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410℃ ISOTHERMAL SECTION OF Al-Cu-Sb PHASE DIAGRAM

CHEN Rongzhen ZHANG Hanxing ZHENG Jianxuan Guangxi University , Nanning , ChinaHE Hanping Guangxi Research Institute of Nonferrous Metals and Geology , Nanning , China CHEN Rongzhen , Professor , Department of Physics of Guangxi University , Nanning , Guangxi 530004 , China

金属学报(英文版)

The 410℃ isothermal section of the phase diagram of Al-Cu-Sb ternary system has been de- termined by means of X-ray powder diffraction method and electron probe microanalysis. The section determined consists of 12 single-phase regions,21 bi-phase regions and 10 tri-phase regions.

关键词: Al-Cu-Sb ternary system , null , null

CORRELATION BETWEEN STRESS COMPONENTS AND STRESS CORROSION CRACKS IN BRASS Lecturer,Department of Materials Physics,University of Science and Technology Beijing,Beijing 100083,China

QIAO Lijie LIU Rui XIAO Jimei University of Science and Technology Beijing , Beijing , China

金属学报(英文版)

The effects of stress components on nucleation sites and propagation directions of stress cor- rosion cracks in brass were investigated with specimens under mode Ⅱ and mode Ⅲ loadings. The results indicated that under mode Ⅱ loading,stress corrosion cracks nucleated on the site with maximum normal stress component and propagated along the plane perpendieular to the maximum normal stress,under mode Ⅲ loading,the stress corrosion crack was not evident on the 45°plane due to the general corrosion in aqueous solution with high NH_4OH concentra- tion,while stress corroded in aqueous solution with low NH_4OH concentration, numerous cracks with spacings of 10—150μm were found on the 45°plane with maximum normal stress and no stress corrosion cracks was observed on the plane with maximum shear stress.

关键词: stress corrosion cracking , null , null , null

Department of Metallurgy and Materials Engineering of Chongqing University

YAN Guangting Chongqing University , Sichuan , China.

材料科学技术（英）

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STATISTICAL EVALUATION OF CRITICAL INCLUSION FACTOR FOR SECONDARY RECRYSTALLIZATON IN 3%Si STEEL Lecturer,Department of Materials Engineering,Southwestern Jiaotong University,Chengdu 610031,China

LI Shuchen Southwestern Jiaotong University , Chengdu , ChinaCHEN Mengzhe KE Jun University of Science and Technology Beijing , Beijing , China

金属学报(英文版)

On the basis of statistical data of MnS in the conventional 3% Si steel sheeets after various annealing processes,the critical inclusion factor has been evaluated to be 20 mm~(-1).The inhi- bition of MnS to grain growth has been exactly described.

关键词: 3%Si steel , null , null

CURRENT STATUS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY AND ITS APPLICATIONS TO MATERIALS SCIENCE AND CONDENSED MATTER PHYSICS

材料科学技术（英）

The present paper summarizes the current status of high resolution elect;on microscopy ( HREM) and the applications of HREM to materials science and condensed matter physics. This review recounts the latest development of high resolution electron microscope, progress of HREM and the applications of HREM, including the crystal structure determination of microcrystalline materials and characterization of the local structure of the defects and nanostructured materials as well as qualitative and quantitative analysis of the grain boundaries, interfaces and interfacial reactions in the advanced materials by means of HREM in combination with electron diffraction, subnanometer level analysis, image simulation and image processing.

关键词: juxtaposed pentagonal antiprisms;two-dimensional quasicrystal;domain;boundary structures;close-packed phases;nanocrystalline materials;crystal-structure;copper oxidation;initial-stage;translational;symmetry;rotational symmetry

Current Status of High Resolution Electron Microscopy and Its Applications to Materials Science and Condensed Matter Physics

Douxing LI and Hengqiang YE (Laboratory of Atomic imaging of Solids , Institute of Metal Research , Chinese Academy of Sciences , Shenyang , 110015 , China)

材料科学技术（英）

The present paper summarizes the current status of high resolution electron microscopy (HREM)and the applications of HREM to materials science and condensed matter physics. This review recounts the latest development of high resolution electron microscope, progress of HREM and the applications of HREM, including the crystal structure determination of microcrystalline materials and characterization of the local structure of the defects and nanostructured materials as well as qualitative and quantitative analysis of the grain boundaries, interfaces and interfacial reactions in the advanced materials by means of HREM in combination with electron diffraction,subnanometer level analysis, image simulation and image processing.

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