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Role of Edge and Screw Dislocations in Deformation of Metals

Chiwei LUNG(International Centre for Materials Physics , Institute of Metal Research , Chinese Academy of Sciences , Shenyang , 110015 , China)

材料科学技术(英文)

It was widely accepted that the screw dislocation is responsible for the strong temperature dependence of the yield stresses observed in bcc metals. In this paper, we show the role of edge dislocations in the deformation of metals and point out that in some cases, its main contribution to the plastic flow behaviour cannot be ignored.

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CURRENT STATUS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY AND ITS APPLICATIONS TO MATERIALS SCIENCE AND CONDENSED MATTER PHYSICS

材料科学技术(英文)

The present paper summarizes the current status of high resolution elect;on microscopy ( HREM) and the applications of HREM to materials science and condensed matter physics. This review recounts the latest development of high resolution electron microscope, progress of HREM and the applications of HREM, including the crystal structure determination of microcrystalline materials and characterization of the local structure of the defects and nanostructured materials as well as qualitative and quantitative analysis of the grain boundaries, interfaces and interfacial reactions in the advanced materials by means of HREM in combination with electron diffraction, subnanometer level analysis, image simulation and image processing.

关键词: juxtaposed pentagonal antiprisms;two-dimensional quasicrystal;domain;boundary structures;close-packed phases;nanocrystalline materials;crystal-structure;copper oxidation;initial-stage;translational;symmetry;rotational symmetry

Current Status of High Resolution Electron Microscopy and Its Applications to Materials Science and Condensed Matter Physics

Douxing LI and Hengqiang YE (Laboratory of Atomic imaging of Solids , Institute of Metal Research , Chinese Academy of Sciences , Shenyang , 110015 , China)

材料科学技术(英文)

The present paper summarizes the current status of high resolution electron microscopy (HREM)and the applications of HREM to materials science and condensed matter physics. This review recounts the latest development of high resolution electron microscope, progress of HREM and the applications of HREM, including the crystal structure determination of microcrystalline materials and characterization of the local structure of the defects and nanostructured materials as well as qualitative and quantitative analysis of the grain boundaries, interfaces and interfacial reactions in the advanced materials by means of HREM in combination with electron diffraction,subnanometer level analysis, image simulation and image processing.

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