材料期刊网

STUDY OF THE INJURY OF THE Ar+ INJECTION Si LAYER BY THE USE OF XRD AND ELLIPSOMETER

G.Q.Wang , F.F.Jiang and X.N.Wang Basic Lessons Department , Shengyang University , Shengyang 110044 , China

金属学报(英文版)

The Ar+ injection layer into silicon can be described as inhomogeneous absorption medium wafer. The distribution of the stress, strain, strain energy in the injury layer has been studied utilizing XRD. And the average ellipsometer is used here to investigate the optical constant and degree of injury of the ion injection injury wafer.

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University of Science and Technology Beijing

JIA Shizhen University of Science and Technology Beijing , China.

材料科学技术（英文）

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Department of Metallurgy and Materials Engineering of Chongqing University

YAN Guangting Chongqing University , Sichuan , China.

材料科学技术（英文）

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Institute of Materials Science at Jilin University——A Brief Overview

WANG Yuming Institute of Materials Science , Jilin University , Changchun , 130023 , China

材料科学技术（英文）

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Abstracts of papers from Journal of University of Science and Technology Beijing

稀有金属（英文版）

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RF deflecting cavity design for bunch length measurement of photoinjector at Tsinghua University

中国物理C

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Design of an MeV ultra-fast electron diffraction experiment at Tsinghua university

中国物理C

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Huazhong University of Science and Technology(H.U.S.T)

材料科学技术（英文）

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Drive laser system for the DC-SRF photoinjector at Peking University

中国物理C doi:10.1088/1674-1137/40/1/017004

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Opening Ceremony of Sichuan Rare-Earth Research Center & Ruisi Rare-Earth Company Holding in Sichuan University

稀土学报(英文版)

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