材料期刊网，材料期刊，材料类期刊，材料期刊投稿

Structure Transition of Nanocrystalline Fe_2O_3

Jian SHA , Xisheng YE , Bin CHEN , Qirui ZHANG and Zhengkuan JIAO(Dept. of Physics , Zhejiang University Hangzhou 310027 , China)Guanglie LU(Central Lab. , Hangzhou University Hangzhou 310028 , China)Zifen PENG and Lide ZHANG(Institute of Solid State Physics , Chi

材料科学技术（英）

A structure transition of Fe2O3 nanocrystal was studied by using DTA and TG thermal analysis and X-ray diffraction method. We found that size increase of the nanocrystals is larger after the structure transition than that before the transition. It means that the structure transition is beneficial on growth of nanocrystals

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用DEPT135测定Resol的组成及微细结构参数

杨金瑞 , 余尚先 , 顾江楠

高分子材料科学与工程

通过对resol(羟甲基酚化合物和低分子量羟甲基酚树脂)DEPT135图谱的分析讨论,得到一系列计算resol微细结构参数的经验公式.根据DEPT135图谱可判断是否发生缩聚反应,根据经验公式可计算酚单体各个活性点参与反应百分率或酚羟基导入率、不同类型缩聚所占百分率及低分子量羟甲基酚树脂的平均核体数.

关键词: 羟甲基酚化合物 , 羟甲基酚树脂 , DEPT135 , 结构参数

Jian ZHANG/Langhong Lou

材料科学技术（英）

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CURRENT STATUS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY AND ITS APPLICATIONS TO MATERIALS SCIENCE AND CONDENSED MATTER PHYSICS

材料科学技术（英）

The present paper summarizes the current status of high resolution elect;on microscopy ( HREM) and the applications of HREM to materials science and condensed matter physics. This review recounts the latest development of high resolution electron microscope, progress of HREM and the applications of HREM, including the crystal structure determination of microcrystalline materials and characterization of the local structure of the defects and nanostructured materials as well as qualitative and quantitative analysis of the grain boundaries, interfaces and interfacial reactions in the advanced materials by means of HREM in combination with electron diffraction, subnanometer level analysis, image simulation and image processing.

关键词: juxtaposed pentagonal antiprisms;two-dimensional quasicrystal;domain;boundary structures;close-packed phases;nanocrystalline materials;crystal-structure;copper oxidation;initial-stage;translational;symmetry;rotational symmetry

Current Status of High Resolution Electron Microscopy and Its Applications to Materials Science and Condensed Matter Physics

Douxing LI and Hengqiang YE (Laboratory of Atomic imaging of Solids , Institute of Metal Research , Chinese Academy of Sciences , Shenyang , 110015 , China)

材料科学技术（英）

The present paper summarizes the current status of high resolution electron microscopy (HREM)and the applications of HREM to materials science and condensed matter physics. This review recounts the latest development of high resolution electron microscope, progress of HREM and the applications of HREM, including the crystal structure determination of microcrystalline materials and characterization of the local structure of the defects and nanostructured materials as well as qualitative and quantitative analysis of the grain boundaries, interfaces and interfacial reactions in the advanced materials by means of HREM in combination with electron diffraction,subnanometer level analysis, image simulation and image processing.

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