Guoqing GU+
,
International Centre for Materials Physics
,
Academia Sinica
,
110015
,
Shenyang
,
ChinaGe CHEN
,
College of Systems Science and Systems Engineering
,
Shanghai Institute of Mechanical Engineering
,
200093
,
ShanghaiK.W.Yu
,
Department of Physics
,
Chin
材料科学技术(英文)
We build the perturbation expansion method for nonlinear composite media and extend the EMA for nonlinear effective conductivity. Using the solutions of boundary-value problems of a cylindrical in- clusion, we derive formulae for nonlinear effective conductivity.
关键词:
effective medium approximation
,
null
Wuming LIU+
,
Shaoyun FU
,
Benlian ZHOU
,
International Centre for Materials Physics
,
Institute of Metal Research
,
Academia Sinica
,
Shenyang
,
110015
,
China
材料科学技术(英文)
Intrinsic localized modes in an order-parameter-preserving antiferromagnet are investigated with employing the Dyson-Maleev transformation and the coherent-state ansatz. These modes which be- low the magnon frequency band correspond to a local large-angle, low-frequency precessional mo- tion of spins, quantum states of which are characterized by the indefiniteness of the number of rele- vant magnons.
关键词:
intrinsic localized mode
,
null
,
null
Douxing LI and Hengqiang YE (Laboratory of Atomic imaging of Solids
,
Institute of Metal Research
,
Chinese Academy of Sciences
,
Shenyang
,
110015
,
China)
材料科学技术(英文)
The present paper summarizes the current status of high resolution electron microscopy (HREM)and the applications of HREM to materials science and condensed matter physics. This review recounts the latest development of high resolution electron microscope, progress of HREM and the applications of HREM, including the crystal structure determination of microcrystalline materials and characterization of the local structure of the defects and nanostructured materials as well as qualitative and quantitative analysis of the grain boundaries, interfaces and interfacial reactions in the advanced materials by means of HREM in combination with electron diffraction,subnanometer level analysis, image simulation and image processing.
关键词: