Guoqing GU+
,
International Centre for Materials Physics
,
Academia Sinica
,
110015
,
Shenyang
,
ChinaGe CHEN
,
College of Systems Science and Systems Engineering
,
Shanghai Institute of Mechanical Engineering
,
200093
,
ShanghaiK.W.Yu
,
Department of Physics
,
Chin
材料科学技术（英文）
We build the perturbation expansion method for nonlinear composite media and extend the EMA for nonlinear effective conductivity. Using the solutions of boundary-value problems of a cylindrical in- clusion, we derive formulae for nonlinear effective conductivity.
关键词:
effective medium approximation
,
null
QIAO Lijie LIU Rui XIAO Jimei University of Science and Technology Beijing
,
Beijing
,
China
金属学报(英文版)
The effects of stress components on nucleation sites and propagation directions of stress cor- rosion cracks in brass were investigated with specimens under mode Ⅱ and mode Ⅲ loadings. The results indicated that under mode Ⅱ loading,stress corrosion cracks nucleated on the site with maximum normal stress component and propagated along the plane perpendieular to the maximum normal stress,under mode Ⅲ loading,the stress corrosion crack was not evident on the 45°plane due to the general corrosion in aqueous solution with high NH_4OH concentra- tion,while stress corroded in aqueous solution with low NH_4OH concentration, numerous cracks with spacings of 10—150μm were found on the 45°plane with maximum normal stress and no stress corrosion cracks was observed on the plane with maximum shear stress.
关键词:
stress corrosion cracking
,
null
,
null
,
null
Douxing LI and Hengqiang YE (Laboratory of Atomic imaging of Solids
,
Institute of Metal Research
,
Chinese Academy of Sciences
,
Shenyang
,
110015
,
China)
材料科学技术（英文）
The present paper summarizes the current status of high resolution electron microscopy (HREM)and the applications of HREM to materials science and condensed matter physics. This review recounts the latest development of high resolution electron microscope, progress of HREM and the applications of HREM, including the crystal structure determination of microcrystalline materials and characterization of the local structure of the defects and nanostructured materials as well as qualitative and quantitative analysis of the grain boundaries, interfaces and interfacial reactions in the advanced materials by means of HREM in combination with electron diffraction,subnanometer level analysis, image simulation and image processing.
关键词:
