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Stereology in Materials Science

LIU Guoquan Department of Materials Science and Engineering , University of Science and Technology Beijing , 100083 , China.

材料科学技术(英文)

Quantitative analysis of populations having a geometric structure,which has developed into a special scientific subject called microstructology or stereology,is of great importance to the characterization and evaluation of microstructures and their evolution in various processes.This paper, besides a brief discussion on those topics such as the recent developments of computer assisted image analysis,mathematical morphology,and fractal analysis,will mainly focus on the scope,fundamen- tals,present status,and perspectives of classical stereology.Several case examples of its application to materials science will also be given.

关键词: stereology , null , null , null

CURRENT STATUS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY AND ITS APPLICATIONS TO MATERIALS SCIENCE AND CONDENSED MATTER PHYSICS

材料科学技术(英文)

The present paper summarizes the current status of high resolution elect;on microscopy ( HREM) and the applications of HREM to materials science and condensed matter physics. This review recounts the latest development of high resolution electron microscope, progress of HREM and the applications of HREM, including the crystal structure determination of microcrystalline materials and characterization of the local structure of the defects and nanostructured materials as well as qualitative and quantitative analysis of the grain boundaries, interfaces and interfacial reactions in the advanced materials by means of HREM in combination with electron diffraction, subnanometer level analysis, image simulation and image processing.

关键词: juxtaposed pentagonal antiprisms;two-dimensional quasicrystal;domain;boundary structures;close-packed phases;nanocrystalline materials;crystal-structure;copper oxidation;initial-stage;translational;symmetry;rotational symmetry

Current Status of High Resolution Electron Microscopy and Its Applications to Materials Science and Condensed Matter Physics

Douxing LI and Hengqiang YE (Laboratory of Atomic imaging of Solids , Institute of Metal Research , Chinese Academy of Sciences , Shenyang , 110015 , China)

材料科学技术(英文)

The present paper summarizes the current status of high resolution electron microscopy (HREM)and the applications of HREM to materials science and condensed matter physics. This review recounts the latest development of high resolution electron microscope, progress of HREM and the applications of HREM, including the crystal structure determination of microcrystalline materials and characterization of the local structure of the defects and nanostructured materials as well as qualitative and quantitative analysis of the grain boundaries, interfaces and interfacial reactions in the advanced materials by means of HREM in combination with electron diffraction,subnanometer level analysis, image simulation and image processing.

关键词:

Laser-Heated Diamond-Anvil Cell (LHDAC) in Materials Science Research

N.V.Ch , ra Shekar , P.Ch.Sahu , K.Govinda Rajan

材料科学技术(英文)

Laser-heated diamond-anvil cell (LHDAC) is emerging as the most suitable, economical and versatile tool for the measurement of a large spectrum of physical properties of materials under extreme pressure and temperature conditions. In this review, the recent developments in the instrumentation, pressure and temperature measurement techniques, results of experimental investigations from the literature were discussed. Also, the future scope of the technique in various avenues of science was explored.

关键词: Laser heating , null , null , null

CSD-La3TaO7薄膜外延生长行为

王耀 , 李成山 , 于泽铭 , 冯建情 , 金利华 , 王辉 , 张平祥

稀有金属

研究CSD技术制备La3TaO7 (LTO)缓冲层过程中前驱液的热分解行为以及热处理工艺对薄膜取向生长的影响,通过选取恰当的LTO前驱液以及快速升温热处理的方法最终获得了良好c轴织构的LTO薄膜.

关键词: 涂层导体 , 缓冲层 , 化学溶液沉积

DEPT135测定Resol的组成及微细结构参数

杨金瑞 , 余尚先 , 顾江楠

高分子材料科学与工程

通过对resol(羟甲基酚化合物和低分子量羟甲基酚树脂)DEPT135图谱的分析讨论,得到一系列计算resol微细结构参数的经验公式.根据DEPT135图谱可判断是否发生缩聚反应,根据经验公式可计算酚单体各个活性点参与反应百分率或酚羟基导入率、不同类型缩聚所占百分率及低分子量羟甲基酚树脂的平均核体数.

关键词: 羟甲基酚化合物 , 羟甲基酚树脂 , DEPT135 , 结构参数

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