以甲基三乙氧基硅烷(MTES)替代部分正硅酸乙酯(TEOS)作为前驱物,采用溶胶-凝胶法制备甲基化改性SiO2膜.用几种已知表面张力的液体测定接触角,分别根据Owens二液法、扩展的Fowkes式以及van OssChaudhury-Good理论等方法求解了不同MTES与TEOS比例SiO2膜的表面自由能及其分量.结果表明,当n (MTES)/n (TEOS)≥0.8时,SiO2膜表面疏水性较好;3种方法计算所得SiO2膜表面自由能的变化规律相同,数值相差不大;随着MTES与TEOS物质的量比的增大,SiO2膜的表面自由能减小,膜表面疏水性的增加主要来自极性分量的贡献.根据van Oss-Chaudhury-Good理论求算出的极性分量比例较其余两种方法稍小.
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