以乌洛托品为络合剂,采用电化学沉积法成功地制备出La掺杂ZnO薄膜.通过对样品的XRD表征,得出生长的样品为ZnO纤锌矿结构,(002)衍射峰随掺杂La3+浓度的增加而向更小角度方向移动,表明少量La3+掺杂进入了ZnO点阵结构中.EDS测量结果显示,La3+以替代的形式进入ZnO晶格中,掺入量为2.4%(原子分数)左右.由XPS测量结果可知,镧离子在薄膜中以+3价的形式存在,PL测量结果进一步证明了La3+能够取代ZnO晶格中Zn2+的格位.
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