对总形变量相同,厚度分别为80和40 μm的Cu-45Ni(at％,下同)合金基带进行再结晶热处理后,采用X射线四环衍射,分析其冷轧织构及再结晶织构;采用电子背散射衍射技术(EBSD),通过对比分析两者高温热处理后立方织构、小角度晶界及孪晶界含量等的变化,研究基带厚度对无磁性Cu-45Ni合金基带立方织构形成的影响.结果表明:对于总形变量均为99％的2种基带,冷轧后均形成“Copper”型轧制织构,且轧制织构对不同厚度的Cu-45Ni合金基带再结晶立方织构的形成影响较小.厚度为40 μm的超薄带在高温热处理后更容易形成较强的立方织构,同时小角度晶界的含量也较高,这主要是由于发生部分再结晶时,厚度小的超薄基带中2个立方晶粒相遇并迅速长大,形成强立方织构的几率要大于普通厚度的基带.
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