采用提拉法成功地生长了高质量的LiGaO2单晶体,生长过程中没有观察到挥发现象.通过四晶X射线衍射、化学腐蚀、光学显微、透过光谱以及原子力显微镜对晶体的质量进行了表征.结果表明:晶体中无包裹物及气泡,具有很高的质量,(001)面晶片的摇摆曲线半高宽仅为16.2 arcsec,正交的(001)、(100)及(010)三个晶面具有不同的腐蚀形貌,其位错密度均低于104/cm2;LiGaO2晶体的吸收边约为220 nm;化学机械抛光后的晶片表面非常光滑,其均方根粗糙度仅为0.1 nm(5×5μm2).
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