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利用X射线衍射分析仪、JSM-5610LV扫描电镜及能谱分析研究钎焊和时效过程中低银Sn-2.5Ag-0.7Cu(0.1RE)/Cu焊点界面区显微组织和Cu6Sn5金属问化合物的生长行为.结果表明:钎焊过程中焊点界面区Cu6Sn5金属间化合物的厚度是溶解和生长两方面共同作用的结果;随着时效时间的延长,焊点界面区Cu6Sn5的形貌由扇贝状转变为层状,其长大动力学符合抛物线规律,由扩散机制控制;添加0.1%稀土元素能有效减慢界面Cu6Sn5金属间化合物在钎焊及时效过程中的长大速度,可改变焊点裂纹的起源位置,提高其可靠性.

参考文献

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