本文采用静电自组装技术在表面阳离子化的SiO2粒子(SiO2-CBAFS)上构筑了高分子刷,并采用核磁、红外、热失重、接触角和原子力显微镜分别表征了组装粉体的结构、组装量以及自组装单层膜的组装行为和表面拓扑形貌.研究结果表明,采用静电自组装技术可以成功地在SiO2-CBAFS上构筑组装量高达27%的高分子刷,远远高于国际上已见报道的采用共价键合法构筑的高分子刷的组装量(20%).研究发现,组装量随聚合物(PS-NH-SO3Na)分子量呈非线性增长,其组装行为受到PS-NH-SO3Na的分子量和溶液浓度的影响.
Polystyrene brushes were constructed on cationically functionallized silica nanoparticles (SiO2-CBAFS) by electrostatic assembly. The structures, assembly amount, self-assembly behavior and topography of the obtained powders (SiO2-CBAFS/PS-NH-SO3 Na) and self-assembly monolayer (Si/SiO2-CBAFS/PS-NH-SO3 Na) were characterized by 1 HNMR, IR, TGA, contact angles and AFM, respectively. The results show that the polymer (PS-NH-SO3Na) can be constructed on SiO2-CBAFS nanoparticles; the weight loss of assembled PS-NH-SO3 Na is as high as 27%, which is much higher than the ones obtained by covalently technique (20%); the relative mass of PS-NH-SO3 Na assembled on SiO2-CBAFS nanoparticles increases nonlinearly with Mn of PS-NH-SO3Na; the assembly behavior between PS-NH-SO3Na and SiO2-CBAFS nanoparticles in solvent is greatly affected by the molecular weight and the mass concentration of PS-NH-SO3Na.
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