在950℃氮化温度下,通过β-Ga2O3粉末与流动的NH3反应35min制备出GaN粉末.XRD、XPS、FTIR、TEM的测量结果表明:GaN粉末是六角纤锌矿结构的单晶晶粒,其晶格常数a=0.3191nm,c=0.5192nm;在粉末表面,Ga和N两种元素比约为1:1;GaN晶粒的形状为棒状.
参考文献
[1] | Nakamura S;Tietian J .[J].Applied Physics Letters,1994,74:1687. |
[2] | Yang Q K;Li A Z;Zhang YG et al.[J].Journal of Crystal Growth,1998,28 |
[3] | Brandt O.;Yang H.;Klann R.;Mullhauser JR.;Ploog KH.;Wunsche HJ. .Recombination dynamics in GaN[J].Journal of Crystal Growth,1998(0):790-793. |
[4] | Nakamura S;Senoh M;Nagahama S .[J].Journal of Applied Physics,1996,35:74. |
[5] | Sakai S;Kurai S;Abe T;Noi y .[J].Japanese Journal of Applied Physics,1996,35:L77. |
[6] | Porowski S. .HIGH PRESSURE GROWTH OF GAN - NEW PROSPECTS FOR BLUE LASERS[J].Journal of Crystal Growth,1996(1/4):583-589. |
[7] | Jhonson W C;Parsons J P;Krew M C .[J].Journal of Physical Chemistry,1932,36:2651. |
[8] | Isherwood B J;Wickenden D K .[J].Journal of Materials Science,1970,5:869. |
[9] | Lorenz M R;Binkowski B .[J].Journal of the Electrochemical Society,1962,109:24. |
[10] | Shi WS.;Wang N.;Lee CS.;Lee ST.;Zheng YF. .Microstructures of gallium nitride nanowires synthesized by oxide-assisted method[J].Chemical Physics Letters,2001(5-6):377-380. |
[11] | Zhang L D;Meng G W;Phillipp F .[J].Materials Science and Engineering,2000,A286:34. |
[12] | Jung Woo-Sik .[J].Materials Letters,2002,57:110. |
[13] | Cho Sungyong;Lee Jongwon;In Yong Park;Seontai Kim .[J].Materials Science and Engineering,2002,B95:275. |
[14] | Lee Heon;James S .Harris Jr[J].Journal of Crystal Growth,1996,169:689. |
[15] | Balkas C M;Basceri C;Davis R F .[J].Powder Diffraction,1995,10:266. |
[16] | Bungaro C;Rapecewicz K;Bernhole J .[J].Physical Review,2000,B61:6720. |
[17] | Yang YG.;Ma HL.;Xue CS.;Zhuang HZ.;Hao XT.;Ma J.;Teng SY. .Preparation and structural properties for GaN films grown on Si (111) by annealing[J].Applied Surface Science: A Journal Devoted to the Properties of Interfaces in Relation to the Synthesis and Behaviour of Materials,2002(1/4):254-260. |
[18] | Pal S.;Sugino T. .Fabrication and characterization of metal/GaN contacts[J].Applied Surface Science: A Journal Devoted to the Properties of Interfaces in Relation to the Synthesis and Behaviour of Materials,2000(1/2):263-267. |
[19] | Liu Shihong.X-ray photo-electron spectroscopy analysis:[M].Science publishing company,1988:93. |
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