利用同步辐射XAFS (X-ray AbsorptionFine Structure)实验及FEFF计算进行数据拟合,研究遗态转化工艺制备的ZnO产物的微观晶体结构参数.研究结果表明,遗态转化工艺得到了ZnO产物,木材结构分级多孔ZnO产物的第一壳层Zn-O距离为0.1986nm,第二壳层Zn-Zn距离为0.3240nm.根据得到的配位壳层Debye-Waller因子较小(ssl=0.00346,ss=0.00780)得出ZnO产物具有较好的有序晶体结构,同时表明在ZnO中,Zn原子第一近邻壳层的O原子有序程度高于其它次近邻壳层原子.
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