使用共混法制备了纳米SiO2/聚酰亚胺复合薄膜，研究了纳米SiO2添加量对该复合薄膜力学性能、电气强度以及耐电晕性能的影响，并讨论了树脂体系的固含量对该复合薄膜耐电晕性能的影响。结果表明：随着SiO2添加量的增大，薄膜的拉伸强度变化不大，但断裂伸长率下降明显，电气强度先升高后降低，SiO2含量为6%时电气强度达到最大值，耐电晕性能提高。随着树脂固含量的增大，薄膜的耐电晕性能也随之提高，最佳树脂固含量为19%。
A nano-SiO2/polyimide film was prepared by blending method, the effects of nano-SiO2 content on the mechanical properties, electric strength and corona-resistance of the film were studied, and the effect of solid content of resin system on the corona-resistance of the film was discussed. The results indicate that with the increase of nano-SiO2 content, the tensile strength of the SiO2/PI film changes little, the elongation at break decreases obviously, the electric strength first increases and then decreases, which attains maximum when the nano-sized SiO2 content is 6%, and the corona-resistance is improved. With the increase of resin solid content, the corona-resistance of the film is improved, and the optimum solid content is 19%.
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