本文以Macherauch内应力分类法为依据，指出存在于各个晶粒的第Ⅱ类内应力（即微观应力）的值是一个随机变量．通常由X射线衍射线的线形分析获得的所谓微观应力值只是第Ⅱ类内应力的离差；而导致衍射线附加位移的伪宏观应力是其均值.综合两者才是材料中第Ⅱ类内应力的确切表达
Microstress measured by X-ray diffraction method is usually characterized bypeak profile. When the classification of internal stress is based on the model suggested by Macherauch, the second kind of internal stress in the crystalline should be associated with the statisticdeviation of strains in various grains with respect to macro-strain.The value of macro-strainleads to the evaluation of the first kind of internal stress. However, in some cases micro-strainalso results in the peak shift of X-ray diffraction profile. Therefore, besides of peak broadening,one should keep an eye on the effect of dricro-strain on peak shift when microstress is evaluated.The peak shift part stands for the average value and the peak broadening stands for its deviation.
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