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采用低压化学气相淀积方法以相对较低的生长温度(900~1050℃)在蓝宝石(0001)衬底上外延生长了6H-SiC单晶薄膜.其晶体质量和结构由X射线衍射谱和喇曼散射谱的测量结果得到确定.俄歇电子能谱和X射线光电子能谱的观察表明所制备的6H-SiC薄膜中的Si-C键的结合能为181.4eV,Si与C的原子比符合SiC的化学配比.扫描电子显微镜的分析显示6H-SiC外延层和蓝宝石衬底间的界面相当平整.由紫外及可见光波段吸收谱的结果得到所生长的6H-SiC的禁带宽度为2.83eV、折射系数在2.5~2.7之间,均与6H-SiC体材料的相应数据一致.

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