采用热分解法制备Ti/IrO2-HfO2二元氧化物涂层电极.通过X射线衍射(XRD)研究了不同Ir/Hf配比涂层的结构特征;采用循环伏安(CV)方法分析了不同电极涂层的比电容、“内/外活性”及电极稳定性,并初步讨论了电极稳定性与涂层结构间的关系.结果表明,添加Hf可改善涂层结构、提高比电容及电极稳定性、且当涂层中HfO2达到50 mol％时电极活性最高、稳定性最佳.
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