基于平面波展开法研究Ⅳ、Ⅲ-Ⅴ和Ⅱ-Ⅵ族半导体材料构成二维三角晶格光子晶体在太赫兹波段的能态密度特性,数值模拟得到Ⅳ族SiC在填充率f=0.8时形成0.037 THz带隙宽度,Ⅱ-Ⅵ族ZnO在填充率f=0.73时形成0.0417 THz带隙宽度,不同填充率情况下Ⅲ-Ⅴ族半导体材料形成0.027 THz带隙宽度,比较数据Ⅱ-Ⅵ族半导体材料形成较宽的带隙,研究结果为太赫兹光子晶体器件的开发提供了理论依据.
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