介绍了四种常用分析方法在自组装功能膜结构及其界面层表征中的新进展.红外光谱是常用的结构分析方法,运用掠角反射红外光谱豆衰减全反射红外光谱可以分析自组装薄膜表面、界面结构以及分子链段的取向;XPS分析可以确定薄膜的化学组成;电镜的运用使直接观察体系的形态、形貌成为可能;ESR是研究聚合物在溶液中自组装成胶束过程的有力工具.
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