主要研究C对Gd5SiGe3磁致冷合金组织结构与居里温度的影响.使用商业蒸馏Gd为原料,采用非自耗电弧炉熔炼了Gd5SiGe3Cx(x=0、0.1、0.3、1.0)系列合金.粉末XRD结果表明,少量C(x=0.1、0.3)加入合金后,样品主相具有单斜的Gd5Si2Ge2型结构,当x=1.0时,合金中出现了CSi相和GdGe相.采用光学显微镜观察了了合金纵截面的微观形貌,纵截面的柱状晶和晶粒内的线条组织是Gd5SiGe3Cx合金显微组织的两大显著特征.用样品振动磁强计测定了样品在低场下(7960A/m)的M-T曲线,结果表明,Gd5SiGe3Cx系列合金的居里温度随C含量的增加而逐渐降低,x=1.0时居里温度达到最低值108K.
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