在540和650℃,含氢60—80ppm的纯Ti板材的屈服强度σ_(0.2)出现降低,进一步增加氢含量,σ_(0.2)不再降低。在室温和540℃,氢含量低于50ppm时,应力-应变曲线上有明显上下屈服点;在650℃或氢含量高于50ppm,明显的上下屈服点消失。由此算得纯Ti中氢原子与位错之间的最大互作用能为0.47—0.53eV。 纯Ti中的氢化物均为片状和针状。在氢含量低于80ppm时,氢化物为体心四方结构TiH_2;高于80ppm,为fcc结构TiH_2。在氢含量低至15ppm的试样中也发现了体心四方结构TiH_2。
The yield strength of the pure Ti plate may be decreased at 540—650℃ for specimen containing H within the range of 60 to 80 ppm, but it is decreased no more in increasing H. The sharp upper-lower yield point is occurred on the stressstrain curve as H content less than 50 ppm at room temperature and 540℃, and disappeared as H over 50 ppm or at 650℃. Thus, the maximum interaction energy between H atom and dislocation in pure Ti was calculated to be 0.47—0.53 eV. The morphology of hydride in pure Ti was observed in the plate or needle shape. The hydride TiH_2 was found to be the structure of BCT or fcc as H content less or more than 80 ppm respectively. It is also observed under HVEM that the hydride in specimen containing 15 ppm H is of BCT structure.
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