Influences of Film Thickness on the Electrical Properties of TaNx Thin Films Deposited by Reactive DC Magnetron Sputtering

材料科学技术（英文）, 2010, 26(7): 597-600.

^1, , ^2, , ^3, , ^4, , ^5,

1.State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China

2.State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China

3.State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China

4.State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China

5.State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China

基金项目: Supporting Project of Sichuan(2010G20156) the Satate Key Laboratory of Electronic Thin Films and Integrated Devices(KFJJ200804)

Influences of Film Thickness on the Electrical Properties of TaNx Thin Films Deposited by Reactive DC Magnetron Sputtering

Hongchuan Jiang ^1, , Chaojie Wang ^2, , Wanli Zhang ^3, , Xu Si ^4, , Yanrong Li ^5,

1.State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China

2.State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China

3.State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China

4.State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China

5.State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China

Keywords： TaNx thin films

TaNx thin films were deposited on commercial polished Al2O3 ceramic substrates by reactive dc magnetron sputtering. The influences of the film thickness on the electrical properties of the samples were examined in detail. It is found that the film thickness does not influence the phase structures of the TaNx thin films. The sheet resistances of the samples shift from 173 Ω/sq. to 7.5 Ω/sq. with the film thickness shifting from 30 nm to 280 nm. With the increase of the film thickness from 30 nm to 280 nm, the temperature coefficient of resistance (TCR) of the samples shifts from negative value to positive value. When the film thickness isabout 100 nm, TaNx thin films exhibits a near-zero TCR value (approximately -15x10-6/℃). This factimplies that TaNx thin films with a null TCR can be obtained by adjusting the film thickness. The variation in the electrical properties of the TaNx thin films with the film thickness can be qualitatively explained by the parallel connection of surface layer with high resistivity and negative TCR and TaNx layer with low resistivity and positive TCR.

参考文献

[1]	C.M. Wang;J.H. Hsieh;Y.Q. Fu .Electrical properties of TaN-Cu nanocomposite thin films[J].Ceramics International,2004(7):1879-1883.
[2]	S. Tsukimoto;M. Moriyama;Masanori Murakami .Microstructure of amorphous tantalum nitride thin films[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2004(1/2):222-226.

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材料期刊网

Influences of Film Thickness on the Electrical Properties of TaNx Thin Films Deposited by Reactive DC Magnetron Sputtering

参考文献