本文采用扣除干扰线强度方法解决了Ti-N化合物中氮的电子探针定量分析问题,为探针分析中处理同级X射线的互相干扰问题提供一种可行的方法。
An improvement by deducting interference method has been developed for treatingthe interference of the same order diffraction X-ray spectrum in electron probe microanalysis.The TiN compound was taken as an example of determination of nitrogen. The result showsthat the method is available.
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