通过电子显微分析，发现在热等静压的ＴｉＡｌ－Ｖ－Ｓｉ合金中有大量的硅化物沿层状结构的相界面析出，这些硅化物为Ｔｉ_５Ｓｉ_３相，通常为近六角形的薄片．Ｔｉ_５Ｓｉ_３相与层状结构基体相（α_２和γ相）间具有如下的固定取向关系［０００１］_（Ｔｉ_５Ｓｉ_３）／／［０００１］_（Ｔｉ_３Ａｌ），（３１２０）_（Ｔｉ_５Ｓｉ_３），／／（１０１０）_（Ｔｉ_３Ａｌ）［０００１］_（Ｔｉ_５Ｓｉ_３）／／［１１１］_（ＴｉＡｌ），（４１５０）_（Ｔｉ_５Ｓｉ_３）／／（１１０）_（ＴｉＡｌ）
Alloying element Si can improve the high-temperature creep resistance of the Ti-rich TiAl intermetallic compound. Numerous Ti_(5)Si_3 phase, precipitated as hexagonal foils along the γ-γ and γ-α_2 interfaces in the lamellar structure, was observed by TEM on the hot isostatic pressing TiAl-V-Si alloy compact. The orientation relationships between this precipitating phase and the TiAl and Ti_(3)Al phase are as follows:[0001]_(Ti_(5)Si_3)Correspondenl: HE Lianlong,research assistant , Institute of Metal Research, Chinese Academy of Sciences,Shenyang 110015
参考文献
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