为了便于测量和计算,通过系统X射线衍射实验研究和理论分析,改进了X射线衍射透射及反射几何关系图,推导出定量计算公式,并创立了晶体取向测量图形.使用这种定量计算公式及图形可以非常简便、迅速而又准确地得到晶体取向的反射衍射斑点θR和透射衍射斑点θT.为了便于精确测量和更有效地利用高级测试仪器,在X射线衍射仪日常工作的同时,使用原有线焦点等实验方法进行了累计X射线衍射宽点拍照研究.结果表明,用射线源线焦点拍照的精确度与点焦点相同,操作方便,并可大大缩短调机和开机时间,充分发挥了X射线衍射仪的作用.
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