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采用直流磁控溅射法在铜基底上制备了TiAlN/SiO2选择性吸收薄膜.通过调整制备过程中的工艺参数,得到优化后的组合薄膜(铜基底),其吸收率可达0.92、发射率为0.06.在此组合膜系中,TiAlN为吸收层,SiO2为减反层.对基底为铜片的样品在550℃退火2h,其性质保持稳定,表明TiAlN/SiO2组合薄膜在高湿太阳能选择性吸收领域具有一定的应用前景.

参考文献

[1] 郭廷玮;李安定;王焕义.太阳能的利用和前景[M].北京:科学普及出版社,1984:10.
[2] 清华大学 .溅射太阳能选择性吸收涂层[P].中国,CN85100142,1986-07-23.
[3] 倪晟,孙卓,赵强.磁控共溅射制备氮化钛铝薄膜及其机械性能的研究[J].功能材料,2005(12):1842-1844,1848.
[4] 曹华伟,张程煜,乔生儒,曹晓雨.物理气相沉积TiAlN涂层的研究进展[J].材料导报,2011(11):25-29.
[5] 李佳,夏长清,刘昌斌,戴晓元.Al含量对(Ti,Al)N涂层结构性能的影响[J].材料导报,2003(12):29-31,35.
[6] M. Y. Kwak;D. H. Shin;T. W. Kang;K. N. Kim .Characteristics of TiN barrier layer against Cu diffusion[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,1999(12):290-293.
[7] Schuler A;Thommen V et al.Structural and optical properties of titanium aluminum nitride films (Ti1-xAlxN)[J].J Vac Sci Techn A:Vac Surf Films,2001,19(03):922.
[8] Barshilia H C;Selvakumar N;Rajam K S et al.Deposition and characterization of TiAlN/TiAlON/Si3N4 tandem absorber prepared using reactive direct current magnetron sputtering[J].Thin Solid Films,2008,516(18):6071.
[9] Jouan P Y;Peignon M C;Cardinaud Ch et al.Characterisation of TiN coatings and of TiN/Si interface by X-ray photoelectron spectroscopy and Auger electron spectroscopy[J].Applied Surface Science,1993,68(04):595.
[10] Briggs D;Seah M P.Practical surface analysis[M].US:John Willey & Sons,1993
[11] Wagner C D .X-ray photoelectron spectroscopy with X-ray photons of higher energy[J].Journal of Vacuum Science and Technology,1978,15(02):518.
[12] Casagrande A;Glisenti A;Lanzoni E et al.TiN,TiC and Ti(C,N) film characterization and its relationship to tribological behaviour[J].Surface and Interface Analysis,1992,18(07):525.
[13] Bendavid A;Martin P;Netterfield R .Optical properties and stress of ion-assisted aluminum nitride thin films[J].Applied Optics,1992(31):6734.
[14] Emmanuel C Onyiriuka .Aluminium,titanium boride,and nitride films sputter-deposited from multicomponent alloy targets studied by XPS[J].Applied Spectroscopy,1993,47(01):35.
[15] Barr T L .The nature of the relative bonding chemistry in zeolites:An XPS study[J].J Zeolites,1990,10(08):760.
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