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利用阳极离子束技术在SKD11型不锈钢和YG6硬质合金上沉积类金刚石( DLC)薄膜,采用扫描电子显微镜、原子力显微镜、Raman光谱分析薄膜微观结构和表面形貌;采用WS-2005型附着力划痕仪和洛氏压力机测试膜基结合强度;采用球磨仪测试膜层耐磨性能。结果表明:利用该技术所制DLC膜是一种非晶结构、表面平整的薄膜,粗糙度Ra 值仅为5.21nm。DLC/Cr/SKD11膜系Raman光谱ID/IG值(0.69)高于DLC/Cr/YG6膜系(1.54),说明SKD11高于YG6所制膜层的sp3C键含量;DLC/Cr/SKD11膜系结合强度(17.8 N)低于DLC/Cr/YG6膜系(39.2 N),且DLC/Cr/YG6膜系的洛氏压痕周围仅有放射状微细裂纹,而DLC/Cr/SKD11膜系的压痕周围存在膜层脱落现象;沉积在SKD11与YG6基体上DLC膜的单位磨损率分别为1.40E-4和8.81E-5,说明YG6基体上DLC膜层的耐磨性要优于SKD11基体上的DLC膜层。由此看出,不同基体上制备的DLC膜层微观结构不同,导致结合性能及耐磨性能不同。

Diamond like carbon films were deposited by the anode ion beam technique on stainless steel (SKD11) and a hard al-loy of W and Co (YG6) substrate. The microstructure and morphology of the films were investigated by scanning electron micros-copy, atomic force microscopy and Raman spectroscopy. Their mechanical and tribological properties were studied by a WS-2005 scratch tester, a Rockwell hardness tester and a ball-cratering tester. Results show that the films are smooth and dense. The surface roughness (Ra) of the films is around 5. 2 nm. The content of sp3 bonds of the film on SKD11 (ID/IG=0. 69) is higher than that on YG6 (ID/IG=1. 54). The bond strength of the film on SKD11 (17. 8 N) is lower than that on YG6 (39. 2 N). There are only mi-nute radial cracks on the film on YG6 while the film on SKD11 is peeled off after Rockwell hardness testing. The wear rate of the film on SKD11 (1. 40E-4) is higher than that on YG6 (8. 81E-5) as revealed by the ball-cratering tests.

参考文献

[1] A. Kathalingam;Mi-Ra Kim;Yeon-Sik Chae;S. Sudhakar;T. Mahalingam;Jin-Koo Rhee .Self assembled micro masking effect in the fabrication of SiC nanopillars by ICP-RIE dry etching[J].Applied Surface Science: A Journal Devoted to the Properties of Interfaces in Relation to the Synthesis and Behaviour of Materials,2011(9):3850-3855.
[2] Feng, W.;Zhou, H.;Yang, S.-Z. .Nano-indentation and wear-resistance behaviors of TiCN films by pulsed plasma on cemented carbide cutting tool[J].Materials Science & Engineering, A. Structural Materials: Properties, Misrostructure and Processing,2010(18/19):4767-4770.
[3] Neto VF;Vaz R;Ali N;Oliveira MSA;Gracio J .Performance of sub-micron diamond films coated on mould inserts for plastic injection moulding[J].Journal of Materials Science,2008(10):3392-3399.
[4] Barshilia H C;Prakash M S;Jain A et al.Structure,hardness and thermal stability of TiAlN and nanolayered TiAlN/CrN mul-tilayer films[J].VACUUM,2005,77(02):169-179.
[5] Neuville S;Matthews A .A perspective on the optimisation of hard carbon and related coatings for engineering applications[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2007(17):6619-6653.
[6] Usman A;Rafiquea M S;Khaleeq-ur-Rahman M et al.Growth and characterization of Ni:DLC composite films using pulsed la-ser deposition technique[J].Materials Chemistry and Physics,2011,126(03):649-654.
[7] Zhang D C;Shen B;Sun F H .Study on tribological behavior and cutting performance of CVD diamond and DLC films on Co-cemented tungsten carbide substrates[J].Applied Surface Sci-ence,2010,256(08):2479-2489.
[8] Ma GJ;Liu XL;Zhang HF;Wu HC;Peng LP .Nanocomposite TiC/a-C : H film prepared on titanium aluminium alloy substrates by PSII assistant MW-ECRCVD[J].Chinese physics,2007(4):1105-1110.
[9] Tunistra F;Koening J L .Raman spectrum of graphite[J].Jour-nal of Chemical Physics,1970,53(03):1126-1130.
[10] Heinke W;Leyland A;Matthews A et al.Evaluation of PVD nitride coatings, using impact, scratch and Rockwell-C adhe-sion tests[J].THIN SOLID FILMS,995,270(1-2):431-438.
[11] 张泰华,郇勇,王秀兰.亚微米氮化钛膜的纳米压痕和划痕测定[J].力学学报,2003(04):498-502.
[12] 白力静,蒋百灵,乔亮,李艳,殷鹏.磁控溅射微纳米梯度镀层对45钢及40Cr钢弹性变形性能的影响[J].机械工程学报,2011(04):32-36.
[13] 邓立允;王玉果;赵立新 等.TiN/TiAlN涂层的断裂韧性研究[J].稀有金属材料与工程,2008,37(增刊1):752-755.
[14] 黄立业,徐可为,吕坚.类金刚石薄膜的表面纳米划擦性能评价[J].无机材料学报,2001(05):1004-1008.
[15] G. B. Stachowiak;G. W. Stachowiak;J. M. Brandt .Ball-cratering abrasion tests with large abrasive particles[J].Tribology International,2006(1):1-11.
[16] Lifshitz Y;Lempert G D;Grossman E .Substantiation of sub-plantation model for diamondlike film growth by atomic force microscopy[J].Physical Review Letters,1994,72(14):2753-2756.
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