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以CH4和N2为反应气体,采用空心阴极放电激发的等离子体增强化学气相沉积法在Si片上制备出了氢化非晶碳氮(a-CNx:H)薄膜.利用原子力显微镜(AFM)对薄膜的表面光洁度及表面形貌进行了测量和表征.利用X射线光电子能谱(XPS)、傅立叶红外吸收谱(FTIR)和纳米压入(nano-indentation)等测试手段分析了薄膜的成分、结构及力学性能.结果表明:薄膜的表面光滑、致密,表面光洁度<1nm.薄膜的最大N含量达到了26.39%(原子分数),对应的N/C为0.41.XPS和FTIR分析表明:薄膜中的C、N原子是通过C-N、CN、C≡N结合的,同时存在一定量的-CHx和-NHx基团.另外,我们发现薄膜的硬度及弹性模量随N2/CH4比的增加而增加,并且主要受微观结构(C-N/C≡N比)的影响.

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