采用移动加热器法生长铟惨杂浓度为5×1017 atoms/cm3的Cd0.9Mn0.1Te (CMT)和Cd0.9Zn0.1Te (CZT)单晶.生长得到的CMT晶体和CZT晶体电阻率范围为4.5×109 ～ 6.2×1010 Ω·cm.CMT晶体的成分均匀性要优于CZT晶体,拟合得到CMT和CZT晶体中Mn和Zn的分凝系数分别为0.95和1.23.富Te区在两种晶体生长过程中都具有显著的提纯作用,In惨杂的浓度范围均在6.4 ～ 14.4 ppm范围内.红外透射显微镜观察到三角形和六边形为主的Te夹杂的尺寸5 ～24 μm,浓度为105 cm-3.除最后结晶区之外,沿晶体生长方向Te夹杂的尺寸逐渐减小而浓度逐渐增大.制备的CMT和CZT探测器对59.5 keV241Am放射源均有能谱响应,能量分辨率分别为23.2％和24.6％.
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