The crystal perfection in GaP epitaxial layers was stuided by the use of double crystal X-ray diffraction,backscattering spectrometry and Raman scattering techniques.GaP films grown on GaAs by low-pressure metalorganic chemical vapor deposition were used as the samples.By means of the morphology and the full-width at half maximum of X-ray diffraction peak for the GaP epilayers,the growth temperature and Ⅴ/Ⅲ ratio were optimized.In addition,the residual stress and strain of a GaP epilayer were calculated,based on Raman scattering measurement.
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