利用Rietveld全谱线形拟合技术定量测定了热轧板表面氧化皮各组成相的含量，谱线拟合时准确、合理地选择晶体学参数和峰形模型是拟合成败的关键。与传统的X射线衍射定量方法相比，Rietveld全谱线形拟合定量分析具有无需标样、适用面广、结果准确等特点。
The volume fractions of the constituent phases of the scale on the hotrolled plate/strip are quantitatively measured by using Rietveld whole spectrum fitting technology. The key issues for successfully fitting the spectrum are the accuracy of reasonable selection of crystallographic parameters and the model of the peak shape. Compared with the traditional quantitative technology of xray diffraction (XRD), Rietveld method is characterized by the merits such as no reference specimen is needed, by applicability and high accuracy.
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