Comparative Study of LiMn2O4 Thin Films Heat-treated by Conventional and Rapid Thermal Annealing

材料科学技术（英文）, 2006, 22(3): 349-352.

^1, , ^2, , ^3, , ^4, , ^5, , ^6,

1.College of Chemistry and Chemical Engineering, Jishou University, Jishou 416000, China

2.College of Chemistry and Chemical Engineering, Jishou University, Jishou 416000, China

3.College of Chemistry and Chemical Engineering, Jishou University, Jishou 416000, China

4.College of Chemistry and Chemical Engineering, Jishou University, Jishou 416000, China

5.College of Chemistry and Chemical Engineering, Jishou University, Jishou 416000, China

6.College of Metallurgical Science and Engineering, Central South University, Changsha 410083, China

基金项目: 湖南省自然科学基金(04JJ40038) 湖南省教育厅科研项目(04C475)

Comparative Study of LiMn2O4 Thin Films Heat-treated by Conventional and Rapid Thermal Annealing

Keywords： Cathode

Cathode meterial LiMn2O4 thin films were prepared by solution deposition followed by conventional thermal annealing (CTA) and rapid thermal annealing (RTA) using lithium acetate and manganese acetate as starting materials. The phase and surface morphology identification was done by X-ray diffraction and scanning electron microscopy. The electrochemical properties of the thin films were carried out by cyclic voltammetry, charge-discharge experiments, electrochemical impedance spectroscopy and potential step technique. The results show that both thin films are homogeneous and crack-free. Compared with the CTA derived thin films, the RTA derived ones with smaller grain size are more smooth and dense. The CTA and RTA derived LiMn2O40.050% and 0.037% per cycle after being cycled 100 times, respectively. The diffusion coefficient of lithium ion in the CTA derived LiMn2O4 thin-film electrode is 4.59×10-11 cm2/s, and that of lithium ion in the RTA derived one is 3.86×10-11 cm2/s.

参考文献

[1]	W C West;J F Whitacre;J R Lim .[J].Journal of Power Sources,2004,126:134.
[2]	S J Lee;J H Bae;H W Lee;H K Baik,S M Lee .[J].Journal of Power Sources,2003,123:61.
[3]	H S Moon;J W Park .[J].Journal of Power Sources,2003,119-121:717.
[4]	Y.S. Yoon;J.S. Kim;S.H. Choi .Structural and electrochemical properties of vanadium oxide thin films grown by d.c. and r.f. reactive sputtering at room temperature[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2004(1/2):41-47.
[5]	M.V. Reddy;C. Wannek;B. Pecquenard;P. Vinatier;A. Levasseur .LiNiVO_4-promising thin films for use as anode material in microbatteries[J].Journal of Power Sources,2003(119/121):101-105.
[6]	M K Kim;H T Chung;Y J Park;J G Kim J T Son K S Park,H G Kim .[J].Journal of Power Sources,2001,99:34.
[7]	J B Bates;N J Dudney;B J Neudecker;F X Hart H P Jun,S A Hackney .[J].Journal of the Electrochemical Society,2000,147:59.
[8]	C Branci;N Benjelloun;J Sarradin;M Ribes .[J].Solid State Ionics,2000,135:169.
[9]	S D Jones;J R Akridge .[J].Journal of Power Sources,1995,54:63.
[10]	J B Bates;N J Dudney;B Neudecker;A Ueda,C D Evans .[J].Solid State Ionics,2000,135:33.
[11]	Y J Park;J G Kim;M K Kim;H T Chung W S Um M H Kim,H G Kim .[J].Journal of Power Sources,1998,76:41.
[12]	K Matsuda;I Taniguchi .[J].Journal of Power Sources,2004,132:156.
[13]	A Eftekhari .[J].Solid State Ionics,2004,167:237.
[14]	J T Son;H G Kim;Y J Park .[J].Electrochimica Acta,2004,50:451.
[15]	Y L Zhang;H C Shin;J Dong;M Liu .[J].Solid State Ionics,2004,171:25.
[16]	M Armand;F Dalard;D Reroo;C Mouliom .[J].Solid State Ionics,1985,15:205.
[17]	A Yamada;M Tanaka;K Tanaka;K Sekai .[J].Journal of Power Sources,1999,81-82:73.
[18]	M N Richard;E W Fuller;J R Dahn .[J].Solid State Ionics,1994,73:81.
[19]	S R Narayanan;D H Shen;S Surampudi;A I Attia,G Halpert .[J].Journal of the Electrochemical Society,1993,140:1854.
[20]	Z W Fu;Q Z Qin .[J].Journal of the Electrochemical Society,1999,146:3914.

上一张下一张

计量

下载量()
访问量()

作者相关

在本站搜索
在百度学术搜索
在万方数据库搜索
在CNKI搜索

文章评分

您的评分：
1

0%
2

0%
3

0%
4

0%
5

0%

材料期刊网

Comparative Study of LiMn2O4 Thin Films Heat-treated by Conventional and Rapid Thermal Annealing

参考文献