High-resolution transmission electron microscope (HRTEM) was employed to investigate the deformation-induced α2→γ phase transformation phenomenon in a hot deformed Ti-45Al-10Nb alloy. Such a tronsformation can be nucleated either at α2/γ interfaces or at stacking faults on the basal planes of the α2 phase. The growth of deformation-induced γplate is accomplished by the motion of α/6<100> Shockley partials on alternate basal planes (0001)α2, and the α/6<100> Shockley partials move in coordination rather than sweep on (0001)α2 plane one by one. It appears that no atom transportation is involved in this stress-induced α2→γ transfromation.
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