研究了H+离子注入对InP材料和1.3μm面发射激光器结构的电学、光学性能的影响.当离子注入后InP表面电学特性退化,在300℃以上退火后,材料表面回复较好,H+离子注入区电阻率约为InP体材料的104倍.接着,将离子注入工艺应用于1.3μm面发射激光器结构电流限制孔径的制作,通过比较电学特性得出450℃的最佳退火温度,并发现高温退火后电致发光强度增强.
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