采用固相反应法制备了Te掺杂的TiCoSb基half-Heusler化合物.X射线衍射分析表明,Te掺杂的TiCoSb化合物是单相.在300~850 K的温度范围内测量了材料的电阻率、赛贝克系数和热导率.结果表明:未经掺杂的TiCoSb化合物是n型半导体,在高温下有很高的赛贝克系数.在Sb位掺杂Te后,材料的电阻率和赛贝克系数的绝对值随着掺杂量的增加明显降低.材料的热导率随着掺杂量的增加而呈小幅度减小.Te掺杂后材料ZT值提高,最高的ZT值比基体提高了5倍多.
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