采用提拉法生长了直径为136mm的Nd3+:GGG单晶,通过X射线衍射和X射线荧光对晶体的结构、成分沿生长方向和径向的变化进行了测试分析.结果表明单胞晶格参数沿晶体的生长方向和径向均逐步变大,平均变化率分别为3.1×10-6(A)/ mm、1.3×10-5(A)/mm;沿着晶体的生长方向,Nd和Gd组分按指数函数规律逐步增加,而Ga组分则按高斯函数逐渐减小.沿晶体径向从内到外,Nd、Gd组分按线性规律逐渐增大,其变化率分别为0.0014 at%/ mm、0.00924 at%/ mm,Ga组分则按线性规律减小,变化率为-0.0117 at%/ mm.这些变化主要是由于Nd3+的分凝效应、Ga挥发所导致.
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