研究在不同工艺条件下用直流反应磁控溅射技术在T10衬底上制备Cr-N涂层,并采用光电子能谱仪和XRD依次分析Cr-N涂层的表面结构和工艺参数对Cr-N涂层成分及相组成的影响.结果表明,Cr-N涂层在存放一段时间后表面产生复杂的Cr2O3相以及Cr(O,N)x相;常温下随着N2含量的增加,涂层相结构逐渐由Cr转变为化学比的CrN相.当N2含量为33.3%时,Cr-N涂层的相成分主要为Cr2N+CrN.并发现衬底偏压直接影响Cr-N系涂层的晶态及取向特征,当偏压增加到-130 V时,Cr-N涂层中β-Cr2N相结构逐渐转变为(110)和(300)取向结构.
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