利用表面机械研磨处理(SMAT)技术在纯Ni上制备一定厚度的纳米晶表层,利用X射线衍射(XRD)和透射电镜(TEM)研究了纳米晶Ni的晶粒生长动力学,计算了描述晶粒生长动力学的时间指数n和晶粒生长激活能Q.研究表明,纳米晶Ni在423~723 K退火时的时间指数n约为0.14.当纳米晶Ni在423 ~523 K退火时,其晶粒生长激活能Q为32.1 kJ/mol,表明在这一温度区间内晶粒生长由晶界和亚晶界的微结构重新排列所控制;当纳米晶Ni在523~723 K退火时,晶粒生长激活能Q为121.3 kJ/mol,表明在这一温度区间内晶粒生长由晶界扩散所控制.TEM观察表明纳米晶Ni在较高温度下退火时出现异常的晶粒长大现象.
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