采用微弧氧化技术,以30g/L的磷酸钠为电解液,利用系统的XRD手段研究了正向电压对AZ31镁合金表面微弧氧化膜层不同厚度的相组成,计算出晶粒尺寸、晶面间距和残余应力的分布规律.结果表明:电压不同膜层中各深度相的衍射峰强度、相组成和结晶度都不同,其中Mg3(PO4)2 (200)峰的晶粒尺寸随电压增加而变粗,且同一电压制备的膜层在同一晶向不同厚度的晶粒尺寸不一样,其值呈至膜层表面距离减小而减小,晶面间距也呈减小趋势；MgO相组成的涂层残余应力处于拉应力,其值随电压增加而显著减小.
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