在简述获得元素分布图实验方法的基础上,介绍利用HitachiHF-2000冷场发射枪透射电子显微镜,采用能量过滤成像技术在材料科学领域开展的研究工作以及取得的一些结果
Elemental mapping with a high spatial resolution is indispensable to characterization of the nanoscale microstructure in the research of materials science. In the present paper, Gatan Model 678 Imaging Filter, which has been attached to HF-2000 FEG TEM, has been employed to study the microstructures at namometer scale in several materials.
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