研究了Ga2O3/Al2O3膜反应自组装制备GaN薄膜.首先利用磁控溅射法在硅衬底上制备Ga2O3/Al2O3膜,再将Ga2O3/Al2O3膜在高纯氨气气氛中氨化反应得到了GaN薄膜.用X射线衍射(XRD),X光光电子能谱(XPS)、扫描电镜(SEM)、透射电镜(TEM)和荧光光谱(PL)对样品进行结构、组分、形貌和发光特性的分析.测试结果表明:用此方法得到了六方纤锌矿结构的GaN晶体膜.
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