采用热丝化学气相沉积(HFCVD)方法在Mo基体上沉积金刚石薄膜,使用扫描电镜(SEM)和X射线衍射(XRD)对薄膜样品进行分析检测,研究了表面形核密度随碳源浓度的变化.结果表明:随着碳源浓度增加表面形核密度增大,当碳源浓度达到3%时,表面形核密度质量最佳,当浓度进一步增大时,形核密度下降;随着碳源浓度增加,生长加快,当生长过快时影响形核过程,形核密度下降.
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